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The study of photoluminescence (PL) of lanthanide-doped semiconducting nanocrystals has become a very exciting field in materials science research. Both spectral and time-resolved luminescence properties are key parameters in assessment of surface contamination, size distribution, upconversion efficiency and PL quantum yield. With the best sensitivity in the industry and the fastest time-resolved phosphorescence detection system, the Quattro™ luminescence spectrometer is the ideal tool to characterize the PL properties of such materials in the UV-VIS range.
 
 
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Raman spectroscopy probes the vibrations (phonons) in a material. These phonons are characteristic of a given material and allow its chemical and structural properties to be investigated.
   
 
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The Industry’s Safest, Most Energy Efficient Ultra-Low Storage Solution for High Value Biologicals.

The Panasonic Twin Guard® Series satisfies an industry demand for safe, long-term storage for the most high-valued materials. Two, independent refrigeration ...
   
 
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3Flex Surface Characterization Analyzer
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OmniScan MX EC Eddy Current Flaw Detector
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microPHAZIR RX Handheld NIR Material Analyzer
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Confocal Raman and Atomic Force Microscope alpha500
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1100C and 1200C Ashing and Burn-Off Furnaces
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  Retsch’s Mixer Mills are suitable for dry, wet and cryogenic grinding small sample volumes as well as for cell disruption and DNA/RNA extraction.
 
   
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The Materials Research Society invites your participation in the 2013 MRS Fall Exhibit. Set for December 3-5, 2013, at the Hynes Convention Center in Boston, Massachusetts, the MRS Fall Exhibit will provide a unique opportunity to present innovative ...
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News
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• New Small Profile, Rugged Digital Output Pressure Sensor Available from Measurement Specialties
• Material Characterization Solutions for Optimization of Pharmaceutical Tableting
• Reproducible DSC Results Now Faster and Easier
• Introducing a New Level of Confidence in GC and GC/MS
• METTLER TOLEDO Launches New Analytical Balance Line Intelligent Features Ensure Compliance and Process Security
   
 
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