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The study of photoluminescence (PL) of lanthanide-doped semiconducting nanocrystals has become a very exciting field in materials science research. Both spectral and time-resolved luminescence properties are key parameters in assessment of surface contamination, size distribution, upconversion efficiency and PL quantum yield. With the best sensitivity in the industry and the fastest time-resolved phosphorescence detection system, the Quattro™ luminescence spectrometer is the ideal tool to characterize the PL properties of such materials in the UV-VIS range.
 
 
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Featured Article
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Industrial and academic scientists working in the development and application of engineered materials are increasingly in need of measurement technologies that can be used closer to the source of the sample or the object requiring analysis. These measurements are often made in more demanding environments, and typically not in traditional analytical or QA/QC labs.
   
 
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Announcement
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From concept to reality, Shimadzu can help you in the development of safer, more reliable, and higher quality materials and products. For over 90 years, Shimadzu has been developing technology that satisfies the most demanding physical measurement and evaluation requirements. From high-precision universal/tensile testing machines and servohydraulic testing systems to fatigue and hardness testers, Shimadzu has a solution for nearly every environment or application. Learn more.
   
 
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New Listings
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Truevolt Series 6½ Digit Digital Multimeters (DMMs)
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VR-3000 One-Shot 3D Measuring Macroscope
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VDC 1012 Vacuum Distiller
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1700C and 1800C High Temperature Box Furnace
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SAXSpace Nanostructure Analyzer
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  Correlative particle analysis provides comprehensive information on metallic, non-metallic, inorganic, and organic particles, and enables automatic particle analysis.
 
   
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The MS&T partnership of ACerS, AIST, ASM, MetSoc and TMS brings together scientists, engineers, students, suppliers and more to discuss current research and technical applications, and to shape the future of materials science and technology.
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News
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• NEW: Laser Particle Sizer ANALYSETTE 22 NanoTec Plus
• Olympus Introduces the BTX Profiler, a Combined XRD-XRF Analyzer for Comprehensive Materials Analysis
• Exeter Analytical Launches New Website
• PHENOM-WORLD Unveils The Third Generation Phenom Desktop Sem – Great Imaging Power Combined With Outstanding Technical Performance
• Malvern Instruments presents new data for on-line zeta potential measurement in water treatment
   
 
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