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Microscopy and Image Analysis
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The Lambda TLED is a stand-alone LED light source that can be used with the transmitted light path of a microscope or in other applications with similar requirements. Features include intensity control, >10,000 hour lifetime, TTL control (with polarity switch), <25 µsecs ON-OFF time, very stable output and compact design. Chose from several LED options including a high-output white light LED suitable for contrast methods such as Phase and Differential Interference Contrast (DIC), and IR-LED for experiments requiring IR-DIC.
 
 
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Featured Article
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Current research and development (R&D) that is focused on efficient energy conversion and environmental protection technologies relies heavily on advances in the development of new and improved functional nano-materials and nano-devices, such as catalysts, batteries, fuel cells, etc. A thorough understanding of the relationship between the nano-structure (shape, size, surface, interface, defects, etc.) of the nano-material system and its performance is vital for applied R&D.
   
 
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Announcement
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The Nomadic™ from BaySpec is the only confocal Raman microscope on the market simultaneously equipped with three excitation sources from visible to NIR (532, 785, 1064 nm or custom), with fully automated operation for laser switching without any adjustment of hardware. It is a versatile platform for all sample situations, with the unique dispersive 1064 nm Raman technology offering unmatched sensitivity and speed for fluorescent samples that are impossible for Raman measurement in the past...
   
 
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New Listings
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BA300Pol Dedicated Polarizing Microscope with Infinity Optics
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LensAFM Atomic Force Microscope and Lens
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Cytation™ 3 Cell Imaging Multi-Mode Reader
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Metallurgical Sample Holder
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XGT-5000WR X-Ray Analytical and Imaging Microscope
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Video
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  Rigaku introduces a new version of the low-maintenance, high-performance Compact HomeLab diffractometer, now with the PILATUS 200K Hybrid Pixel Array Detector as standard.
 
   
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Inter/Micro is an internationally recognized conference that attracts microscopists from all areas of light and electron microscopy.
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News
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• Bruker and 3M Sign Exclusive Patent License Agreement
• Syngene US Appoints Product Specialist and Manufacturer’s Representative To Support Growth in Demand for Unique Image Analysis Technology
• Ventana and Barco Revolutionize Digital Pathology Viewing Experience
• Newport Extends Series of Integrity™ VCS Vibration Control Systems
• FEI Helios 1200AT DualBeam System Accelerates Process Development and Ramp
   
 
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