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Microscopy and Image Analysis Newsletter
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Dynamic Image Analysis is superior to methods like sieve analysis and laser diffraction in its resolution, precision and reproducibility. On top of that it provides detailed particle shape information. RETSCH TECHNOLOGY’S new
CAMSIZER XT
with its patented two-camera system is ideally suited for dry and wet measurement of fine powders in a size range from 1 µm to 3 mm.
 
 
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Featured Article
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Most microscopists are familiar with confocal microscopy from neuroscience or cell biology. However, very quietly and abruptly, confocal has jumped the fence into industry, becoming a major tool-of-choice for measuring surface texture and wear as well as evaluating thin film thickness and counting, sizing, and defining distribution of particles in epitaxial films.
   
 
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Featured Product
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A true scientific CMOS in every sense, Neo has been conceptualised and specifically engineered to harness the full performance potential of this new and exciting sensor technology. Unlike any CCD or CMOS camera to come before, Neo is unique in its ...
   
 
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New Listings
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620-IR FT-IR Spectrochemical Imaging Microscope
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ZEISS MERLIN Field Emission Scanning Electron Microscopes
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alpha300 S Scanning Near-field Optical Microscope
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EZRaman-xB Portable Raman System
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MFC-2000 Z-Axis Drive and Controller
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Video
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  The new dispersive 1064 Raman spectrometer family from Bayspec features the Nomadic™ Raman Microscope; RamSpec™ 1064 Raman spectrometer; MovingLab™ Raman Microscope; and Agility™ 1064 Raman Analyzer. 1064 Raman is a nondestructive, powerful technique that requires little sample preparation. 1064 Raman remains the same regardless of the excitation wavelength, reduces fluorescence interference, and serves as a cost-effective alternative for FT-Raman. The 1064 Raman spectrometer family has ...
 
   
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Event
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The 2013 MRS Spring Meeting will host 56 technical sessions, an international exhibit, a variety of special events and tutorial sessions, and much more.
   
 
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News
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New Sensors Unlimited 2048-pixel InGaAs Linescan Camera for 3-D Optical Coherence Tomography
Jenoptik Introduces New Products at Photonics West 2013
New Photron Data Acquisition (DAQ) Plug-In
XEI Scientific reports on how RJ Lee Group has applied Evactron® plasma technology for specimen cleaning.
International Slide Scanner Competition Awards Olympus VS120® Virtual Slide Microscope System Three First Place Honors
   
 
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