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SurveyIR™ is a new FT-IR Microspectroscopy accessory that mounts in the sample compartment of FT-IR spectrometers. SurveyIR couples integrated digital video microscopy with IR microspectroscopy in a user-installed compact package. SurveyIR features transmission, reflection, and diamond-ATR spectrometry modes and includes integrated sample contact alert and pressure feedback for ATR mode. eSpot™ software provides masking aperture control, illumination control, live video image observation, and image capture.
 
 
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Featured Article
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Parts-per-quadrillion sensitivity reveals miniscule markers, from those created by nuclear blasts weapons to trace impurities in pharmaceuticals.
   
 
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New Listings
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ZEISS Xradia X-ray Microscopes for Nondestructive, 3D Imaging
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Patriot Optical Emission Spectrometer
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J457 Automatic Refractometer
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PA1000 Microplate Bar Code Print & Apply System
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RatioMaster Ratio Microscope Based Spectrofluorometer
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Video
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  In this presentation, we will illustrate how CIC was used to measure total organic chlorine (TOCl), total organic bromine (TOBr), and total organic iodine (TOI) in pool and spa water samples. CIC allowed the measurement of both known and unknown halogenated DBPs under multiple conditions, providing important new insights into these compounds. Correlation of TOCl, TOBr, and TOI with the mutagenicity of these waters was also determined. The speciation provided by these measurements (e.g., ...
 
   
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   Event
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Dr. John A. Reffner of John Jay College (New York, N.Y.) and Dr. David W. Schiering of Czitek (Danbury, Conn.) will present a course on hands-on FTIR Microspectroscopy.
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News
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Electrical Cell-Substrate Impedance Spectroscopy Shows Fat Cells Changing Into Bone Tissue Cells
Breakthrough Optical and Quantum Experiments Could Lead to Novel Forms of Quantum Sensing
Linear Ion Trap Makes 2-D Mass Spectrometry More Accessible
Highlights From the 2016 Confocal Raman Imaging Symposium
Novel Antireflective Structures Show Promise for Photovoltaic Devices
   
 
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